APA Style
Hosmer, David W., Lemeshow, Stanley, Sturdivant, Rodney X.. (2013).
Applied Logistic Regression (3rd ed. pdf ed.).
Hoboken, NJ:
John Wiley & Sons.
Chicago Style
Hosmer, David W., Lemeshow, Stanley, Sturdivant, Rodney X..
Applied Logistic Regression.
3rd ed. pdf ed.
Hoboken, NJ:
John Wiley & Sons,
2013.
Electronic Resource.
MLA Style
Hosmer, David W., Lemeshow, Stanley, Sturdivant, Rodney X..
Applied Logistic Regression.
3rd ed. pdf ed.
Hoboken, NJ:
John Wiley & Sons,
2013.
Electronic Resource.
Turabian Style
Hosmer, David W., Lemeshow, Stanley, Sturdivant, Rodney X..
Applied Logistic Regression.
3rd ed. pdf ed.
Hoboken, NJ:
John Wiley & Sons,
2013.
Electronic Resource.